My research is focused on thermal characterisation and thermal management of high power RF and power conveter electronic devices. I have extensive expertise in semiconductor device simulation, design and construction of optical-based instruments, and applying advanced characterisation techniques.

Key Research Interests

• Advanced Thermography: incuding Raman thermography, using lasers to map "hot spots" inside transistors with sub-micron precision and nanosecond temporal resolution. Working on the developement of super-resolution thermal imaging.

• Wide and ultra-wide Bandgap semiconductors like Gallium Nitride (GaN), AlGaN and Ga2O3 , which are essential for 5G/6G and electric vehicles.

• Thermal management: A major focus on GaN-on-Diamond technology—joing semiconductors to diamond substrates to dissipate heat more efficiently. Improving thermal boundary resistances between epitaxial layers and substrates,  thermal interface materials and adanced heat spreaders including metal/diamond composites.

• Device Reliability: Studying the physical causes of device failure, such as electric field stress and thermal boundary resistance at material interfaces. Applying techniques such as electric field induced second harmonic generation (EFISHG) and electrolumensce microscosopy/spectroscopy.