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Publication - Professor Siyuan Yu

    Robust TE0 + TE1 Waveguide Crossing

    Citation

    Xu, P, Zhang, Y, Chen, Y & Yu, S, 2019, ‘Robust TE0 + TE1 Waveguide Crossing’. in: 2018 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2018: 2018, 29 July–3 August, Hong Kong, China. Optical Society of America (OSA)

    Abstract

    We proposed a silicon waveguide crossing device supporting both TE0 and TEl modes, TE0 mode insertion loss about -1 -1.2 dB and TE1 insertion loss about -0.5 -1 dB, and the crosstalk is better than -30 dB.

    Full details in the University publications repository