We provide services to the commercial sector and to Government institutions.
Please contact us for quotation and details.
Examples of our work includes:
- Measurements of junction temperature in AlGaN/GaN HFETs during operation for accelerated life time tests
- Mapping of temperature fields in GaAs MMIC HPA modules
- Thermal resistance in heteroepitaxial device structures. Examples include: GaN on SiC, Si and diamond
- Electrical device characterization
- Reliability and failure analysis of AF & power electronic devices
- Device electrical and thermal modelling